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High Temperature Capacitive Strain GageCapacitive strain gages designed for measurements in wind tunnels to 2000 F were built and evaluated. Two design approaches were followed. One approach was based on fixed capacitor plates with a movable ground plane inserted between the plates to effect differential capacitive output with strain. The second approach was based on movable capacitor plates suspended between sapphire bearings, housed in a rugged body, and arranged to operate as a differential capacitor. A sapphire bearing gage (1/4 in. diameter x 1 in. in size) was built with a range of 50,000 and a resolution of 200 microstrain. Apparent strain on Rene' 41 was less than + or - 1000 microstrain from room temperature to 2000 F. Three gage models were built from the Ground Plane Differential concept. The first was 1/4 in. square by 1/32 in. high and useable to 700 F. The second was 1/2 in. square by 1/16 in. high and useable to 1440 F. The third, also 1/2 in. square by 1/16 in. high was expected to operate in the 1600 to 2000 F range, but was not tested because time and funding ended.
Document ID
19900004444
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Wnuk, Stephen P., Jr.
(HITEC Products, Inc. Ayer, MA, United States)
Wnuk, Stephen P., III
(HITEC Products, Inc. Ayer, MA, United States)
Wnuk, V. P.
(HITEC Products, Inc. Ayer, MA, United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1990
Publication Information
Publisher: NASA
Subject Category
Instrumentation And Photography
Report/Patent Number
NASA-CR-4266
NAS 1.26:4266
Accession Number
90N13760
Funding Number(s)
CONTRACT_GRANT: NAS1-18668
PROJECT: RTOP 324-02-00
CONTRACT_GRANT: SBIR-08.08-6963
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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